• DocumentCode
    477140
  • Title

    Inspection of fabric defects based on wavelet analysis and BP neural network

  • Author

    Shu-Guang Liu ; Qu, Ping-Ge

  • Author_Institution
    Sch. of Electron. & Inf., Xi´´an Polytech. Univ., Xian
  • Volume
    1
  • fYear
    2008
  • fDate
    30-31 Aug. 2008
  • Firstpage
    232
  • Lastpage
    236
  • Abstract
    In the textile production, there may appear many fabric defects. To fabric defects, there are a lot of image-based inspection techniques: Fourier transform, Sobel algorithm of edge inspection, fast Fourier transform (FFT) et. However, Wavelet transform is a kind of multiresolution algorithm, and its multiresolution character corresponds to time-frequency multiresolution of human vision. The result of the research indicates that wavelet transform gives better results than the other traditional methods. So in this article, we use wavelet transform and BP neural network together to inspect and classify the fabric defects. A plain white fabric is adopted as the sample, and the distinguishing defects are oil stains, warp-lacking, and weft-lacking. An area camera with 256times256 resolution is used in the scheme, a grabbed image is transmitted to a computer for wavelet transform, and then the corresponding image data are then used in BP neural network as input. The result shows that the fabric defectspsila classification rate can be up to 95% with above method.
  • Keywords
    automatic optical inspection; backpropagation; fabrics; image classification; image resolution; neural nets; textile industry; wavelet transforms; BP neural network; Fourier transform; Sobel algorithm; edge inspection; fabric defect classification; fast Fourier transform; image-based inspection technique; multiresolution algorithm; textile production; wavelet transform; Fabrics; Fast Fourier transforms; Fourier transforms; Inspection; Neural networks; Production; Textiles; Time frequency analysis; Wavelet analysis; Wavelet transforms; BP neural network; Wavelet analysis; fabric defects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2238-8
  • Electronic_ISBN
    978-1-4244-2239-5
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2008.4635782
  • Filename
    4635782