DocumentCode :
477141
Title :
Integrated evaluator extracted from infringement lawsuits using Back Propagation Neural Network
Author :
Lai, Yi-hsuan ; Che, Hui-Chung ; Wang, Szu-yi
Author_Institution :
Inst. of Technol. Manage., Chung Hua Univ., Hsinchu
Volume :
1
fYear :
2008
fDate :
30-31 Aug. 2008
Firstpage :
237
Lastpage :
248
Abstract :
This study aims at the basis of patent law and proposes an integrated evaluator constructed by a revolutionary evaluation model. Regardless of stock performance or revenue generated by the enterprise, the damage award of a patent infringement lawsuit is deemed to be a legal value of a patent in view of the patent law. Effective samples are extracted from 4,289 patent infringement lawsuits retrieved in U.S. district courts of Delaware, California and Texas. 17 quantitative indicators for describing dimensions of patents are summarized for the Back Propagation Neural Network incorporated with the Factor Analysis, so as to build the evaluation model which generating the integrated evaluator. The evaluation model is validated to be feasible by error analysis and is accommodated to applications of patent transaction deal, patent licensing, hypothecation of intangible assets, shareholding by patent-based technologies, and venture capital, etc.
Keywords :
backpropagation; enterprise resource planning; financial management; law; neural nets; patents; stock markets; U.S. district courts; back propagation neural network; enterprise revenue generation; factor analysis; infringement lawsuits; intangible assets hypothecation; integrated evaluator; patent infringement lawsuit; patent law; patent licensing; patent transaction deal; patent-based technology; revolutionary evaluation model; stock performance; venture capital; Art; Legal factors; Licenses; Marketing and sales; Neural networks; Patent law; Pattern analysis; Pattern recognition; Technology management; Wavelet analysis; Back Propagation Neural Network; Damage Award; Factor Analysis; Lawsuit; Patent Assessment; Patent Evaluation; Patent Infringement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-2238-8
Electronic_ISBN :
978-1-4244-2239-5
Type :
conf
DOI :
10.1109/ICWAPR.2008.4635783
Filename :
4635783
Link To Document :
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