DocumentCode
477141
Title
Integrated evaluator extracted from infringement lawsuits using Back Propagation Neural Network
Author
Lai, Yi-hsuan ; Che, Hui-Chung ; Wang, Szu-yi
Author_Institution
Inst. of Technol. Manage., Chung Hua Univ., Hsinchu
Volume
1
fYear
2008
fDate
30-31 Aug. 2008
Firstpage
237
Lastpage
248
Abstract
This study aims at the basis of patent law and proposes an integrated evaluator constructed by a revolutionary evaluation model. Regardless of stock performance or revenue generated by the enterprise, the damage award of a patent infringement lawsuit is deemed to be a legal value of a patent in view of the patent law. Effective samples are extracted from 4,289 patent infringement lawsuits retrieved in U.S. district courts of Delaware, California and Texas. 17 quantitative indicators for describing dimensions of patents are summarized for the Back Propagation Neural Network incorporated with the Factor Analysis, so as to build the evaluation model which generating the integrated evaluator. The evaluation model is validated to be feasible by error analysis and is accommodated to applications of patent transaction deal, patent licensing, hypothecation of intangible assets, shareholding by patent-based technologies, and venture capital, etc.
Keywords
backpropagation; enterprise resource planning; financial management; law; neural nets; patents; stock markets; U.S. district courts; back propagation neural network; enterprise revenue generation; factor analysis; infringement lawsuits; intangible assets hypothecation; integrated evaluator; patent infringement lawsuit; patent law; patent licensing; patent transaction deal; patent-based technology; revolutionary evaluation model; stock performance; venture capital; Art; Legal factors; Licenses; Marketing and sales; Neural networks; Patent law; Pattern analysis; Pattern recognition; Technology management; Wavelet analysis; Back Propagation Neural Network; Damage Award; Factor Analysis; Lawsuit; Patent Assessment; Patent Evaluation; Patent Infringement;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-2238-8
Electronic_ISBN
978-1-4244-2239-5
Type
conf
DOI
10.1109/ICWAPR.2008.4635783
Filename
4635783
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