• DocumentCode
    477141
  • Title

    Integrated evaluator extracted from infringement lawsuits using Back Propagation Neural Network

  • Author

    Lai, Yi-hsuan ; Che, Hui-Chung ; Wang, Szu-yi

  • Author_Institution
    Inst. of Technol. Manage., Chung Hua Univ., Hsinchu
  • Volume
    1
  • fYear
    2008
  • fDate
    30-31 Aug. 2008
  • Firstpage
    237
  • Lastpage
    248
  • Abstract
    This study aims at the basis of patent law and proposes an integrated evaluator constructed by a revolutionary evaluation model. Regardless of stock performance or revenue generated by the enterprise, the damage award of a patent infringement lawsuit is deemed to be a legal value of a patent in view of the patent law. Effective samples are extracted from 4,289 patent infringement lawsuits retrieved in U.S. district courts of Delaware, California and Texas. 17 quantitative indicators for describing dimensions of patents are summarized for the Back Propagation Neural Network incorporated with the Factor Analysis, so as to build the evaluation model which generating the integrated evaluator. The evaluation model is validated to be feasible by error analysis and is accommodated to applications of patent transaction deal, patent licensing, hypothecation of intangible assets, shareholding by patent-based technologies, and venture capital, etc.
  • Keywords
    backpropagation; enterprise resource planning; financial management; law; neural nets; patents; stock markets; U.S. district courts; back propagation neural network; enterprise revenue generation; factor analysis; infringement lawsuits; intangible assets hypothecation; integrated evaluator; patent infringement lawsuit; patent law; patent licensing; patent transaction deal; patent-based technology; revolutionary evaluation model; stock performance; venture capital; Art; Legal factors; Licenses; Marketing and sales; Neural networks; Patent law; Pattern analysis; Pattern recognition; Technology management; Wavelet analysis; Back Propagation Neural Network; Damage Award; Factor Analysis; Lawsuit; Patent Assessment; Patent Evaluation; Patent Infringement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-2238-8
  • Electronic_ISBN
    978-1-4244-2239-5
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2008.4635783
  • Filename
    4635783