DocumentCode
477144
Title
Research of vision recognition on auto rack girders based on improved ART2 neural network and D-S evidence theory
Author
Han, Li-Qiang ; Wang, Hua ; Gao, Ji-Gang ; Zhang, Shuang
Author_Institution
Coll. of Mech. Sci. & Eng., Changchun Inst. of Technol., Changchun
Volume
1
fYear
2008
fDate
30-31 Aug. 2008
Firstpage
259
Lastpage
264
Abstract
For typepsilas recognition of camion rack girders, this paper puts forward a pattern recognition method based on improved ART2 neural network and D-S evidence theory. Firstly, for collected auto rack girders top images, region is partitioned to 16 equal regions ( 4times4 ) , which covers high-frequency wavelet coefficient with one-layer wavelet transform, and gained local variance of wavelet coefficient in every sub-region is used as a character template; in the same way, is partitioned to 16 sub-images (4times4), estimating numbers of gray value ldquo1rdquo in every sub-region, to gain the area character template. Secondly, data of two character templates are used as inputs of improved ART2 neural network, to gain data of joint weights of network, and the basal confidence m2 , m2 . Finally, gain the total confidence with composition rule of D-S evidence theory, according to the maximum of the total confidence, to recognize types of auto rack girders. Experiments indicate this algorithm may solve on-line vision recognition on hundreds of auto rack girders very well, and possesses advantage of more rapid , more precise and more reliable etc. Typepsilas recognition of camion rack girders has a more broad application future and higher practicality, based on neural network and D-S evidence theory.
Keywords
ART neural nets; computer vision; image recognition; inference mechanisms; wavelet transforms; ART2 neural network; D-S evidence theory; auto rack girder top image; camion rack girder; on-line vision recognition; pattern recognition method; vision recognition; wavelet coefficient; wavelet transform; Machine vision; Neural networks; Pattern analysis; Pattern recognition; Production facilities; Structural beams; Wavelet analysis; Wavelet coefficients; Wavelet domain; Wavelet transforms; Character template; D-S evidence theory; Improved ART2 neural network; Pattern recognition; Wavelet coefficient;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2008. ICWAPR '08. International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-2238-8
Electronic_ISBN
978-1-4244-2239-5
Type
conf
DOI
10.1109/ICWAPR.2008.4635786
Filename
4635786
Link To Document