• DocumentCode
    477222
  • Title

    Radiation measurement accuracy of Z-dynamic hohlraums

  • Author

    Idzorek, G.C. ; Tierney, T.E. ; Watt, R.G.

  • Author_Institution
    Los Alamos National Laboratory, PO Box 1663, Mail Stop D-410, New Mexico, USA
  • Volume
    1
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    49
  • Lastpage
    52
  • Abstract
    As calculational capabilities mature the data accuracy requirements become more stringent. Typical Z-pinch power measurements use multiple sets of filtered X-Ray Diodes1 (XRD) to provide temporally and spectrally resolved information on the pinch performance within a +/− 12% error bar. Integrated power measurements are provided by Ni-foil bolometers2 with +/− 10% accuracy
  • Keywords
    Bolometers; Cathodes; Connectors; Diodes; Laboratories; Material properties; Plasma temperature; Power measurement; Wire; X-ray scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 2007 16th IEEE International
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0913-6
  • Electronic_ISBN
    978-1-4244-0914-3
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4651788
  • Filename
    4651788
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=477222