Title :
Radiation measurement accuracy of Z-dynamic hohlraums
Author :
Idzorek, G.C. ; Tierney, T.E. ; Watt, R.G.
Author_Institution :
Los Alamos National Laboratory, PO Box 1663, Mail Stop D-410, New Mexico, USA
Abstract :
As calculational capabilities mature the data accuracy requirements become more stringent. Typical Z-pinch power measurements use multiple sets of filtered X-Ray Diodes1 (XRD) to provide temporally and spectrally resolved information on the pinch performance within a +/− 12% error bar. Integrated power measurements are provided by Ni-foil bolometers2 with +/− 10% accuracy
Keywords :
Bolometers; Cathodes; Connectors; Diodes; Laboratories; Material properties; Plasma temperature; Power measurement; Wire; X-ray scattering;
Conference_Titel :
Pulsed Power Conference, 2007 16th IEEE International
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0913-6
Electronic_ISBN :
978-1-4244-0914-3
DOI :
10.1109/PPPS.2007.4651788
