High frequency characterization of carbon nanotube films

Author

Wu, Ziran ; Wang, Lu ; Xin, Hao

Author_Institution

Phys. Dept., Tucson, AZ

fYear

2008

fDate

15-19 Sept. 2008

Firstpage

1

Lastpage

2

Abstract

Carbon nanotube films are characterized using Vector Network Analyzer (VNA) and Terahertz Time-Domain Spectroscopy (THz-TDS). Both transmission and reflection experiments are performed in order to measure the complex refractive index and the wave impedance. This method allows simultaneous extraction of both the permittivity and permeability without any assumptions. Experimental results are obtained from microwave to THz for various multi-walled and single-walled nanotube samples.

Keywords

carbon nanotubes; high-frequency effects; permeability; permittivity; refractive index; thin films; time-domain analysis; C; carbon nanotube films; high frequency characterization; permeability; permittivity; refractive index; terahertz time-domain spectroscopy; vector network analyzer; wave impedance; Carbon nanotubes; Frequency; Impedance measurement; Optical films; Performance evaluation; Permittivity measurement; Reflection; Refractive index; Spectroscopy; Time domain analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Infrared, Millimeter and Terahertz Waves, 2008. IRMMW-THz 2008. 33rd International Conference on

Conference_Location

Pasadena, CA

Print_ISBN

978-1-4244-2119-0

Electronic_ISBN

978-1-4244-2120-6

Type

conf

DOI

10.1109/ICIMW.2008.4665477

Filename

4665477