• DocumentCode
    478581
  • Title

    Veritas: Combining Expert Opinions without Labeled Data

  • Author

    Cholleti, Sharath R. ; Goldman, Sally A. ; Blum, Avrim ; Politte, David G. ; Don, Steven

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Washington Univ., St. Louis, MO
  • Volume
    1
  • fYear
    2008
  • fDate
    3-5 Nov. 2008
  • Firstpage
    45
  • Lastpage
    52
  • Abstract
    We consider a variation of the problem of combining expert opinions for the situation in which there is no ground truth to use for training. Even though we don´t have labeled data, the goal of this work is quite different from an unsupervised learning problem in which the goal is to cluster the data into different groups. Our work is motivated by the application of segmenting a lung nodule in a computed tomography (CT) scan of the human chest. The lack of a gold standard of truth is a critical problem in medical imaging. A variety of experts, both human and computer algorithms, are available that can mark which voxels are part of a nodule. The question is, how to combine these expert opinions to estimate the unknown ground truth. We present the Veritas algorithm that predicts the underlying label using the knowledge in the expert opinions even without the benefit of any labeled data for training. We evaluate Veritas using artificial data and real CT images to which a synthetic nodule has been added, providing a known ground truth.
  • Keywords
    computerised tomography; image segmentation; medical image processing; unsupervised learning; Veritas algorithm; computed tomography scan; data cluster; lung nodule segmention; medical imaging; unknown ground truth; unsupervised learning problem; Biomedical imaging; Boosting; Computed tomography; Error analysis; Gold; Humans; Image segmentation; Lungs; Medical diagnostic imaging; USA Councils; machine learning; medical images; unlabeled data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on
  • Conference_Location
    Dayton, OH
  • ISSN
    1082-3409
  • Print_ISBN
    978-0-7695-3440-4
  • Type

    conf

  • DOI
    10.1109/ICTAI.2008.141
  • Filename
    4669670