Title :
Using Imputation Techniques to Help Learn Accurate Classifiers
Author :
Su, Xiaoyuan ; Khoshgoftaar, Taghi M. ; Greiner, Russell
Author_Institution :
Comput. Sci. & Eng., Florida Atlantic Univ., Boca Raton, FL
Abstract :
It is difficult to learn good classifiers when training data is missing attribute values. Conventional techniques for dealing with such omissions, such as mean imputation, generally do not significantly improve the performance of the resulting classifier. We proposed imputation-helped classifiers, which use accurate imputation techniques, such as Bayesian multiple imputation (BMI), predictive mean matching (PMM), and Expectation Maximization (EM), as preprocessors for conventional machine learning algorithms. Our empirical results show that EM-helped and BMI-helped classifiers work effectively when the data is "missing completely at random", generally improving predictive performance over most of the original machine learned classifiers we investigated.
Keywords :
belief networks; expectation-maximisation algorithm; learning (artificial intelligence); pattern classification; Bayesian multiple imputation; expectation maximization; imputation techniques; imputation-helped classifiers; machine learned classifiers; machine learning algorithms; mean imputation; predictive mean matching; Bayesian methods; Classification tree analysis; Computer science; Data engineering; Decision trees; Logistics; Machine learning algorithms; Niobium; Training data; USA Councils;
Conference_Titel :
Tools with Artificial Intelligence, 2008. ICTAI '08. 20th IEEE International Conference on
Conference_Location :
Dayton, OH
Print_ISBN :
978-0-7695-3440-4
DOI :
10.1109/ICTAI.2008.60