Title :
An Improved AETG Test Suite Optimization Method Based on Regressing Test Model
Author :
Li, Kewen ; Yang, Zhixia
Author_Institution :
Coll. of Comput. & Commun. Eng., China Univ. of Pet., Dongying
Abstract :
Optimizing test suite can reduce the cost of time and resources, and improve the efficiency of regression test when test cases are generated. In this paper, the effect of factorspsila combination in systems is considered sufficiently, and an improved AETG pair-wise cover technique is proposed. The method of schema matching is used in the process of selecting level values of factors, so that the quantity of redundant test cases and the selecting time can be decreased. The method can generate fewer test cases sooner than the original one by performance analyses, and achieve the aim of optimizing new generated test suite.
Keywords :
optimisation; program testing; AETG pair-wise cover technique; AETG test suite optimization; regressing test model; schema matching; Computer science; Cost function; Educational institutions; Electronic mail; Optimization methods; Petroleum; Software engineering; Software quality; Software testing; System testing; AETG; pair-wise; regression test; schema matching; test suite optimization;
Conference_Titel :
Computer Science and Software Engineering, 2008 International Conference on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-0-7695-3336-0
DOI :
10.1109/CSSE.2008.540
