DocumentCode :
480094
Title :
Damaged Mechanism Research of RS232 Interface under Electromagnetic Pulse
Author :
Gao Jing ; Sun Ji-yin ; Chai Yan-jie ; Wang Bo ; Tao Ling-jiao ; Bao Fei-hu
Author_Institution :
Xi´an Res. Inst. of High-tech, Xi´an
Volume :
3
fYear :
2008
fDate :
12-14 Dec. 2008
Firstpage :
1119
Lastpage :
1122
Abstract :
RS232 interface executes the role of Transportation and Communication, which has became the important interface between MCU of embedded system and peripheral equipment. Because RS232 mainly work in bottom of communication protocol, so it is important to protect the infrastructure of RS232. In test, pulse double electromagnetic is pulled into RS232 data transmission lines by coupling clamp, simulated differential-mode pulse voltage, basing on the test data, it will get the damaged mechanism of RS232 interface, meanwhile presenting the Logistic model of injected voltage pulse and probability of damage to the port interface, and getting the performance evaluation of RS232 interface, moreover estimating the voltage pulse range of upper and lower bounds at the port in the normal and damage state.
Keywords :
electromagnetic pulse; embedded systems; fault tolerance; peripheral interfaces; protocols; RS232 data transmission lines; RS232 interface; communication protocol; coupling clamp; damaged mechanism research; electromagnetic pulse; embedded system; injected voltage pulse; logistic model; lower bound; performance evaluation; peripheral equipment; port interface; pulse double electromagnetics; simulated differential-mode pulse voltage; transportation and; upper bound; voltage pulse range; Computer peripherals; Data communication; EMP radiation effects; Electromagnetic coupling; Embedded system; Protection; Protocols; Testing; Transportation; Voltage; EMP; Logistic-Regression; RS232-Interfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Software Engineering, 2008 International Conference on
Conference_Location :
Wuhan, Hubei
Print_ISBN :
978-0-7695-3336-0
Type :
conf
DOI :
10.1109/CSSE.2008.852
Filename :
4722537
Link To Document :
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