DocumentCode
480639
Title
Design of Wireless Test and Measurement System with High Sampling Rate Based on WSN
Author
Song, Ping ; Qi, Guangping ; Li, Kejie
Author_Institution
Sch. of Aerosp. Sci. & Eng., Beijing Inst. of Technol., Beijing
Volume
2
fYear
2008
fDate
20-22 Dec. 2008
Firstpage
775
Lastpage
779
Abstract
The usual wireless sensor network based on MCU (micro-control unit) is not suitable to test fast changing signals. We designed an intelligent wireless test and measurement system based on wireless sensor network, which can be applied to measure the fast dynamic signals. Changeable sampling rate is designed according to the specific application background in this system. CPLD (complex programmable logic device) is used as the main controller for the high and changeable sampling rate and MCU cooperated with a transceiver for the communication of node. A "first-memory-then-transmission-mechanism" (FMTTM) and a two stages mechanism are proposed, which based on the limited hardware resource. These mechanisms deal well with the relation of the system performance and limited resource. The experiments indicate that the system works well and its design is successful based on ad-hoc network. The complicated system with intelligence can measure a field signal from 1 Msps to 200 Ksps sampling rate reliably and accurately.
Keywords
computerised instrumentation; microcontrollers; programmable logic devices; wireless sensor networks; CPLD; ad-hoc network; complex programmable logic device; first-memory-then-transmission-mechanism; measurement system; micro-control unit; wireless sensor network; wireless test; Communication system control; Hardware; Intelligent networks; Intelligent sensors; Programmable logic devices; Sampling methods; Signal design; System testing; Transceivers; Wireless sensor networks; WSN; changeable sampling rate; data acquisition system; field signal; measurement system;
fLanguage
English
Publisher
ieee
Conference_Titel
Intelligent Information Technology Application, 2008. IITA '08. Second International Symposium on
Conference_Location
Shanghai
Print_ISBN
978-0-7695-3497-8
Type
conf
DOI
10.1109/IITA.2008.199
Filename
4739870
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