• DocumentCode
    48086
  • Title

    Mixing Drivers in Clock-Tree for Power Supply Noise Reduction

  • Author

    Kaplan, Yakov ; Wimer, Shmuel

  • Author_Institution
    Eng. Fac., Bar-Ilan Univ., Ramat-Gan, Israel
  • Volume
    62
  • Issue
    5
  • fYear
    2015
  • fDate
    May-15
  • Firstpage
    1382
  • Lastpage
    1391
  • Abstract
    In today´s process technologies, power supply noise may cause serious clock jitter and circuit malfunction. Noise occurs by the fast and simultaneous voltage switching. A primary contributor to the noise is the clock-tree and the underlying sequential circuits that switch simultaneously, thus causing high current peaks. This work proposes to spread the switching of the clock-tree drivers, while maintaining low skew at the sinks of the tree, where the clocked circuits are connected. Driver switching characterization has been used for fast computation of peak currents, delays and slopes, integrated in a two-phase algorithm. It first constructs the clock-tree in a top-down traversal, employing a mix of high threshold voltage (HVT) and weak low threshold voltage (LVT) clock-drivers. A bottom-up delay correction phase then takes place, aiming at clock skew minimization. The algorithm was implemented in 40 nanometers TSMC process technology, achieving 35% to 70% clock-tree peak current reduction, translated to similar reduction in power supply noise. The proposed method can easily be combined with other existing methods to further reduce the noise.
  • Keywords
    clocks; driver circuits; sequential circuits; HVT clock-drivers; LVT clock-drivers; TSMC process technology; bottom-up delay correction phase; circuit malfunction; clock jitter; clock skew minimization; clock-tree driver switching; clock-tree peak current reduction; current peaks; driver switching characterization; high-threshold voltage clock-drivers; low-threshold voltage clock-drivers; mixing drivers; peak current; power supply noise reduction; process technology; sequential circuits; simultaneous voltage switching; size 40 nm; top-down traversal; two-phase algorithm; Clocks; Delays; Noise; Power supplies; SPICE; Switches; Wires; Clock drivers; clock network; clock-tree; power supply noise;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2015.2411778
  • Filename
    7097114