• DocumentCode
    481148
  • Title

    A machine learning based approach of robust parameter design

  • Author

    Cui, Qing´an ; He, Zhen ; Cui, Nan

  • Author_Institution
    Department of Industrial Engineering, Tianjin University, 300072, China
  • fYear
    2006
  • fDate
    6-7 Nov. 2006
  • Firstpage
    443
  • Lastpage
    448
  • Abstract
    Dual response surface methodology (DRSM) and nonparametric methodology (NPM) are main approaches used to achieve robust parameter design (RPD) of industrial processes and products. When the relationship between influential input factors and output quality characteristic of a process is very complex, both approaches have their limitations. For DRSM, it fails to fit the real response surfaces of process mean and variance by using the second order polynomial models. For NPM, it is hard to optimize parameters of fitting equation, and it needs more experiments as well. From a machine learning perspective, this paper generalizes RPD as a restricted active learning problem and proposes a new approach to achieve it. It fits process mean and variance responses by support vector machines (SVM), and then optimizes levels of design parameters by genetic algorithm. In order to reduce experiment times, the influence of priori knowledge on generalized error of fitting model is studied. Then a prior knowledge based experiment design is developed. Moreover, the approach selects the form of kernel function and optimizes parameters in SVM by comparing the upper bounds of generalized error of different SVM models without extra samples. The example given in the paper shows that, the generalized error and the experiment times of the approach decrease by no less than 45% and 39% respectively, compared with traditional approaches. All these results demonstrate the adaptability and superiority of the approach proposed in the paper.
  • Keywords
    Product design; parameter estimation; quality control; robust; support vector machines;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Technology and Innovation Conference, 2006. ITIC 2006. International
  • Conference_Location
    Hangzhou
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-696-9
  • Type

    conf

  • Filename
    4752040