DocumentCode
481487
Title
Embedded system of temperature testing based on DS18B20
Author
Shen, Hongyao ; Fu, Jianzhong ; Chen, Zichen
Author_Institution
Institute of Manufacturing Engineering, Zhejiang University, Hangzhou, 310027, China
fYear
2006
fDate
6-7 Nov. 2006
Firstpage
2223
Lastpage
2226
Abstract
The paper introduces a new system of temperature testing. It uses ARM S3C44BOX as its microcontroller, with the 1-Wire digital thermometer DS18B20 as a temperature sensor. This paper introduces the temperature testing principle of DS18B20, the design of hardware and software, and the optimized arithmetic of Search ROM command, which is most important in the software realization.
Keywords
DS18B20; S3C44BOX; Temperature; route-remember arithmetic;
fLanguage
English
Publisher
iet
Conference_Titel
Technology and Innovation Conference, 2006. ITIC 2006. International
Conference_Location
Hangzhou
ISSN
0537-9989
Print_ISBN
0-86341-696-9
Type
conf
Filename
4752381
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