Title :
A State-Based Predictive Approach for Leakage Reduction of Functional Units
Author :
Pan, Linfeng ; Guo, Minyi ; Yang, Yanqin ; Wang, Meng ; Shao, Zili
Author_Institution :
Dept. of Comput. Sci. & Eng., Shanghai Jiao-Tong Univ., Shanghai
Abstract :
As MOSFETs (metal-oxide-semiconductor field effect transistor) dimensions enter the sub-micrometer region, reducing leakage power becomes a significant issue of VLSI industry. In this paper, we propose a novel prediction approach to predict idleness of functional units for leakage energy management. Using a state-based predictor, historical utilization information of functional units is exploited to adjust the state of the predictor so as to enhance the accuracy of prediction. We implement our approach based on SimpleScalar and conduct experiments with a suite of fourteen benchmarks from Trimaran. The experimental results show that our approach achieves the better results compared with the previous work.
Keywords :
MOS integrated circuits; VLSI; integrated circuit design; low-power electronics; MOSFET; VLSI design; functional unit; leakage energy management; leakage power reduction; metal-oxide-semiconductor field effect transistor; state-based predictive approach; submicrometer region; Computer science; Energy management; MOSFETs; Pervasive computing; Power engineering and energy; Power engineering computing; Power supplies; Threshold voltage; Ubiquitous computing; Very large scale integration; Dual Thresholds; Leakage Energy Management; Power-Gating; State-based Predictor;
Conference_Titel :
Embedded and Ubiquitous Computing, 2008. EUC '08. IEEE/IFIP International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-0-7695-3492-3
DOI :
10.1109/EUC.2008.175