• DocumentCode
    481865
  • Title

    Thermal process robust identification using wavelet de-noise and least-squares method

  • Author

    Liu, Changliang ; Li, Taoyong ; Cen, Wei ; Jia, Yanchen

  • Author_Institution
    Sch. of Control Sci. & Eng., North China Electr. Power Univ., Baoding
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    1948
  • Lastpage
    1951
  • Abstract
    Unmodeled dynamics exit when modeling with transfer function model set for thermal process. Unmodeled dynamics and stochastic disturbances are considered as colored noise which makes least-squares estimates bias. De-colored noise using wavelet MRA is beneficial to enhance identification accuracy and robust. This is also proved by simulation with a linear time-invariant system. The proposed method processed operation data comes from thermal process and got satisfying result.
  • Keywords
    least mean squares methods; parameter estimation; signal denoising; wavelet transforms; de-colored noise; least-squares estimates bias; least-squares method; linear time-invariant system; stochastic disturbances; thermal process robust identification; transfer function model set; unmodeled dynamics; wavelet de-noise; Colored noise; Multiresolution analysis; Noise measurement; Noise robustness; Nonlinear dynamical systems; Power engineering and energy; Power system modeling; System identification; Thermal engineering; Transfer functions; Parameter estimation; System identification; Unmodeled dynamics; Wavelet De-noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758254
  • Filename
    4758254