DocumentCode
481865
Title
Thermal process robust identification using wavelet de-noise and least-squares method
Author
Liu, Changliang ; Li, Taoyong ; Cen, Wei ; Jia, Yanchen
Author_Institution
Sch. of Control Sci. & Eng., North China Electr. Power Univ., Baoding
fYear
2008
fDate
10-13 Nov. 2008
Firstpage
1948
Lastpage
1951
Abstract
Unmodeled dynamics exit when modeling with transfer function model set for thermal process. Unmodeled dynamics and stochastic disturbances are considered as colored noise which makes least-squares estimates bias. De-colored noise using wavelet MRA is beneficial to enhance identification accuracy and robust. This is also proved by simulation with a linear time-invariant system. The proposed method processed operation data comes from thermal process and got satisfying result.
Keywords
least mean squares methods; parameter estimation; signal denoising; wavelet transforms; de-colored noise; least-squares estimates bias; least-squares method; linear time-invariant system; stochastic disturbances; thermal process robust identification; transfer function model set; unmodeled dynamics; wavelet de-noise; Colored noise; Multiresolution analysis; Noise measurement; Noise robustness; Nonlinear dynamical systems; Power engineering and energy; Power system modeling; System identification; Thermal engineering; Transfer functions; Parameter estimation; System identification; Unmodeled dynamics; Wavelet De-noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location
Orlando, FL
ISSN
1553-572X
Print_ISBN
978-1-4244-1767-4
Electronic_ISBN
1553-572X
Type
conf
DOI
10.1109/IECON.2008.4758254
Filename
4758254
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