“On-the-Fly” Monitoring With a Single-Shot Terahertz Time-Domain Spectrometer

Author

Jeunesse, Pierre ; Schmidhammer, Uli

Author_Institution

Fac. des Sci. d´´Orsay, Univ. Paris-Sud 11, Orsay, France

Volume

13

Issue

1

fYear

2013

fDate

Jan. 2013

Firstpage

44

Lastpage

49

Abstract

We demonstrate the application of a new and ultrafast terahertz (THz) time-domain spectrometer for the nondestructive evaluation of targets that are optically opaque and are composed of several subunits. Thanks to the single-shot capability and the kilohertz acquisition rate of the spectrometer, objects can be analyzed during free fall. The integrity of the objects and their structural subunits as packaging material can be verified by the large amount of information available from THz time-domain spectroscopy. The time of flight, overall absorption, and spectrally resolved absorption can be used to reconstruct the 2-D image along the vertical axis of movement and the depth of the objects.

Keywords

absorption; high-speed optical techniques; image reconstruction; image sensors; monitoring; submillimetre wave detectors; terahertz wave detectors; terahertz wave imaging; terahertz wave spectra; 2D image reconstruction; free fall analysis; kilohertz acquisition rate; nondestructive target evaluation; on-the-fly monitoring; remote detection; single-shot ultrafast terahertz time-domain spectrometer; spectrally resolved absorption; structural subunit packaging material; vertical axis movement; Optical imaging; Optical pulses; Optical sensors; Probes; Time domain analysis; Ultrafast optics; Nondestructive evaluation; THz time-domain spectroscopy; remote detection; terahertz (THz) imaging; time of flight (TOF);

fLanguage

English

Journal_Title

Sensors Journal, IEEE

Publisher

ieee

ISSN

1530-437X

Type

jour

DOI

10.1109/JSEN.2012.2219306

Filename

6316056