• DocumentCode
    481937
  • Title

    A complex spectral analysis of the stator current dedicated to the defects monitoring of squirrel cage induction motors

  • Author

    Razik, H. ; Andriamalala, R. ; Correa, Mauricio B. R. ; da Silva, E.R.C.

  • Author_Institution
    Groupe de Recherches en Electrotech. et Electron. de Nancy, Univ. Henri Poincare - Nancy 1, Nancy
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    3061
  • Lastpage
    3066
  • Abstract
    Nowadays, the induction motor is an important element in industrial process in terms of safety and efficiency. In order to limit the cost induced by a defect, we have to make an early detection. Consequently, the earlier incipient faults will be detected the cheaper remediable faults will be. So, one of the widespread method to monitor the process is the spectral analysis of the stator current. Usually, the real fast Fourier transform (FFT) is used. Despite its waning achievement in regards of on-line methods, the complex FFT gives more information about the healthy state of the motor. So, a comparison of these two approaches in this paper will allow the users to better conclude or not to failure of the induction motor. Moreover, a sliding version of the discrete Fourier transform is conceivable even if the signal to analyse is real or complex. This technique is highly recommendable when updated spectrum is necessary at each sampling time. Experimental results show the efficiency of the complex FFT in comparison to the classical one.
  • Keywords
    discrete Fourier transforms; spectral analysis; squirrel cage motors; complex spectral analysis; defects monitoring; discrete Fourier transform; fast Fourier transform; squirrel cage induction motors; stator current; Costs; Discrete Fourier transforms; Fast Fourier transforms; Fault detection; Induction motors; Monitoring; Safety; Signal analysis; Spectral analysis; Stators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758449
  • Filename
    4758449