DocumentCode :
481946
Title :
Analytical modeling of semiconductor losses in three level inverter for FACTS applications
Author :
Mancilla-David, Fernando ; Venkataramanan, Giri
Author_Institution :
Univ. of Colorado Denver, Denver, CO
fYear :
2008
fDate :
10-13 Nov. 2008
Firstpage :
3219
Lastpage :
3226
Abstract :
Power circuits used in prototype applications for flexible AC transmission systems (FACTS) have consisted of multiple three level or neutral point clamped power converters interfaced to the power system using transformer arrangements for improving waveform quality. This paper presents analytical modeling to determine semiconductor losses in such multi-pulse voltage source DC-AC converters used for FACTS applications. Device current and voltage waveforms during all operating conditions are used to develop behavioral loss models to determine power losses in each of the power semiconductors constituting an inverter pole. The results are used to determine the total power losses in an SSSC application. Computer simulation waveforms are used to demonstrate overall system performance.
Keywords :
DC-AC power convertors; flexible AC transmission systems; invertors; power semiconductor devices; power transformers; FACTS applications; behavioral loss models; computer simulation; computer simulation waveforms; flexible AC transmission systems; multiple three level converters; multipulse voltage source DC-AC converters; neutral point clamped power converters; power circuits; semiconductor losses; three level inverter; transformer arrangements; waveform quality; Analytical models; Application software; Computer simulation; Flexible AC transmission systems; Flexible printed circuits; Inverters; Power system analysis computing; Power system modeling; Prototypes; System performance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
Conference_Location :
Orlando, FL
ISSN :
1553-572X
Print_ISBN :
978-1-4244-1767-4
Electronic_ISBN :
1553-572X
Type :
conf
DOI :
10.1109/IECON.2008.4758476
Filename :
4758476
Link To Document :
بازگشت