DocumentCode :
48246
Title :
A Simple and Robust Method for Estimating Afterpulsing in Single Photon Detectors
Author :
Humer, Gerhard ; Peev, Momtchil ; Schaeff, Christoph ; Ramelow, Sven ; Stipcevic, Mario ; Ursin, Rupert
Author_Institution :
Austrian Inst. of Technol., Vienna, Austria
Volume :
33
Issue :
14
fYear :
2015
fDate :
July15, 15 2015
Firstpage :
3098
Lastpage :
3107
Abstract :
Single photon detectors are important for a wide range of applications each with their own specific requirements, which makes necessary the precise characterization of detectors. Here, we present a simple and cost-effective methodology of estimating the dark count rate, detection efficiency, and afterpulsing in single photon detectors purely based on their counting statistics. This methodology extends previous work [IEEE J. Quantum Electron., vol. 47, no. 9, pp. 1251-1256, Sep. 2011], [Electron. Lett., vol. 38, no. 23, pp. 1468-1469, Nov. 2002]: 1) giving upper and lower bounds of afterpulsing probability, 2) demonstrating that the simple linear approximation, put forward for the first time in [Electron. Lett. , vol. 38, no. 23, pp. 1468-1469, Nov. 2002], yields an estimate strictly exceeding the upper bound of this probability, and 3) assessing the error when using this estimate. We further discuss the requirements on photon counting statistics for applying the linear approximation to different classes of single photon detectors.
Keywords :
optical testing; photodetectors; photon counting; probability; statistical analysis; afterpulsing probability; dark count rate estimation; linear approximation; photon counting statistics; single photon detectors; Approximation methods; Detectors; Histograms; Photonics; Probability; Robustness; Time measurement; Afterpulsing; Photodetectors; Photodiodes; photodetectors; photodiodes;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2015.2428053
Filename :
7097635
Link To Document :
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