Title :
Design Techniques for a Mixed-Signal I/Q 32-Coefficient Rx-Feedforward Equalizer, 100-Coefficient Decision Feedback Equalizer in an 8 Gb/s 60 GHz 65 nm LP CMOS Receiver
Author :
Thakkar, Chintan ; Narevsky, Nathan ; Hull, Christopher D. ; Alon, Elad
Author_Institution :
Univ. of California, Berkeley, Berkeley, CA, USA
Abstract :
This paper describes a mixed-signal I/Q 32-coefficient receive-side feedforward equalizer (RX-FFE) and 100-coefficient decision feedback equalizer (DFE) for a 60 GHz baseband. Integrated in 65 nm LP CMOS with variable gain amplifiers (VGA), analog phase rotator (PR), and clock generation and phase adjustment circuits, the I/Q equalizer supports 60 GHz WiGig non-line-of-sight (NLOS) channels with > 12 ns of delay spread while consuming 66 mW from a 1.2 V supply at 8 Gb/s. Energy-efficient equalization is achieved by the RX-FFE using a proposed switching matrix architecture, and by implementing the multi-coefficient FFE-DFE summing with cascoded current integration.
Keywords :
CMOS integrated circuits; decision feedback equalisers; feedforward amplifiers; millimetre wave receivers; mixed analogue-digital integrated circuits; switching circuits; wireless channels; 100-coefficient decision feedback equalizer; DFE; LP CMOS Receiver; NLOS channel; PR; RX-FFE; VGA; WiGig nonline-of-sight channel; analog phase rotator; bit rate 8 Gbit/s; clock generation; energy-efficient equalization; frequency 60 GHz; mixed-signal I/Q 32-coefficient receive-side feedforward equalizer; mixed-signal i/q 32-coefficient Rx-feedforward equalizer; multicoefficient FFE-DFE summing; phase adjustment circuit; power 66 fW; size 65 nm; switching matrix architecture; variable gain amplifier; voltage 1.2 V; wireless gigabit alliance; Baseband; Decision feedback equalizers; Delays; Feedforward neural networks; Gain; Switches; 60 GHz; Baseband; current integration; decision feedback equalizer (DFE); feedforward equalizer (FFE); inter-symbol-interference (ISI); mixed-signal; switched capacitor;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2014.2360917