Title :
A physics-based compact model for ESD protection diodes under very fast transients
Author :
Manouvrier, Jean-Robert ; Fonteneau, Pascal ; Legrand, Charles-Alexandre ; Beckrich-Ros, Helene ; Richier, Corinne ; Nouet, Pascal ; Azais, Florence
Author_Institution :
STMicroelectronics, Crolles, France
Abstract :
In this paper, a complete analysis of the physical phenomena occurring in ESD protection diodes during very fast transients is investigated. Based on TCAD simulations and transient characterization, it is highlighted that the mobility degradation effect must also be taken into account in addition to the conductivity modulation effect for modeling diode behavior during triggering. A new physics-based compact model of ESD protection diodes is proposed, demonstrated and validated under very fast transient events in the CDM time domain.
Keywords :
electrostatic discharge; isolation technology; semiconductor device models; semiconductor diodes; technology CAD (electronics); transient analysis; ESD protection diodes; STI diodes; TCAD simulations; conductivity modulation effect; fast transient events; mobility degradation; physics-based compact model; triggering; Conductivity; Degradation; Diodes; Electronic mail; Electrostatic discharge; Power system transients; Predictive models; Protection; Transient analysis; Voltage control;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-58537-146-4
Electronic_ISBN :
978-1-58537-147-1
