DocumentCode :
48336
Title :
Defect Diagnostics of Scribing Failures and Cu-Rich Debris in Cu(In,Ga)Se 
Thin-Film Solar Modules With Electroluminescence and Thermography
Author :
Misic, Boris ; Pieters, Bart E. ; Schweitzer, Ulrich ; Gerber, Andreas ; Rau, Uwe
Author_Institution :
IEK-5 Photovoltaik, Forschungszentrum Julich, Julich, Germany
Volume :
5
Issue :
4
fYear :
2015
fDate :
Jul-15
Firstpage :
1179
Lastpage :
1187
Abstract :
We study the appearance of both scribing failures and Cu-rich debris, formed during Cu(In,Ga)Se2 (CIGS) coevaporation, in electroluminescence (EL) and dark lock-in thermography (DLIT) images. We observe that for most of the defect types, there is a characteristic appearance of EL and DLIT that allows reliable diagnostics. We also point to defect scenarios where different defects appear similar. With regard to scribing defects, we find that the reliability of defect identification increases with the length of the line interruption, while for Cu-rich debris, we find that the geometrical size and position within the cell significantly determine its defect appearance and, therefore, the ability to diagnose it.
Keywords :
copper; copper compounds; electroluminescence; failure analysis; gallium compounds; indium compounds; infrared imaging; solar cells; thin film devices; CIGS; Cu(InGa)Se2; Cu-rich debris; DLIT; EL; dark lock-in thermography; defect appearance; defect identification reliability; electroluminescence; geometrical size; line interruption; scribing failure defect diagnostics; thin film solar module; Electroluminescence; Glass; Heating; Microscopy; Photovoltaic cells; Photovoltaic systems; Cu debris; Cu(In,Ga)Se2 (CIGS); P1; P2; P3; defects; diagnostics; scribing lines;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2015.2422143
Filename :
7097644
Link To Document :
