• DocumentCode
    483386
  • Title

    A.1 ESD protection targets

  • Author

    Duvvury, Charvaka

  • Author_Institution
    Texas Instruments, USA
  • fYear
    2008
  • fDate
    7-11 Sept. 2008
  • Firstpage
    339
  • Lastpage
    339
  • Abstract
    In light of the work from the Industry Council on ESD Target Levels it has become clear that the ESD protection designs for the IC pins may be carrying an unnecessary burden. This burden becomes a problem when the IC circuits are trying to meet speed and performance demands. Through this workshop we will review the current ESD requirements for HBM, MM and CDM and discuss the reasons why this load must be shifted to better ESD control methods while defining the realistic specification targets for each stress model. The audience participation will be involved to address the following questions. What are the realistic component IC ESD requirements? How should the ESD designers and IC designers work together to achieve these? At what levels do the designs become impossible? What types of circuits are intolerable to even minimum ESD targets? Are the ESD designers responsible for system level protection also?
  • Keywords
    Circuits; Councils; Earth Observing System; Electrostatic discharge; Instruments; Pins; Protection; Stress control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
  • Conference_Location
    Tucson, AZ, USA
  • Print_ISBN
    978-1-58537-146-4
  • Electronic_ISBN
    978-1-58537-147-1
  • Type

    conf

  • Filename
    4772153