DocumentCode
483392
Title
C1. system level stress and the impact on device ESD protection
Author
Smedes, Theo
Author_Institution
NXP Semiconductors, USA
fYear
2008
fDate
7-11 Sept. 2008
Firstpage
345
Lastpage
345
Abstract
The IEC 61000-4-2 is a standard that specifies ESD requirements for systems, not for ICs. The system level ESD standard differs fundamentally and significantly from the component level tests. Traditionally protections against system level ESD were added on the PC as discrete devices. In recent years semiconductor manufacturers are confronted more and more by requests from customers to specify IC ESD levels according to IEC 61000-4-2. This raises the question how the IC manufacturers should deal with such ‘inappropriate’ specifications from their customers. Should such requirements be banned? Do we need to take a worst-case approach? Is it fundamentally impossible to find solutions? How should system level ESD protections be characterized? Several related studies have been published. The IEC published a technical specification for a certain class of ICs. The ESDA is writing a standard practice method, dubbing the standard as ‘Human Metal Model’. This workshop is your opportunity to learn, question, defend and challenge the system level requirements for ICs and the proposed test methods. Panelists will be available to initiate the discussion, but the workshop can only succeed with your active participation.
Keywords
Earth Observing System; Electrostatic discharge; Humans; IEC standards; Protection; Semiconductor device manufacture; Stress; System testing; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th
Conference_Location
Tucson, AZ, USA
Print_ISBN
978-1-58537-146-4
Electronic_ISBN
978-1-58537-147-1
Type
conf
Filename
4772159
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