DocumentCode
483415
Title
Cross-order echelle grating triplexer based on amorphous silicon nanowire platform
Author
Zhu, Ning ; Song, Jun ; Wosinski, Lech ; He, Sailing
Author_Institution
Centre for Opt. & Electromagn. Res., Zhejiang Univ., Hangzhou
fYear
2008
fDate
14-16 Oct. 2008
Firstpage
1
Lastpage
2
Abstract
We present fabrication and measurement results of an ultracompact silicon-on-insulator-based echelle-grating triplexer, which uses different diffraction orders to cover a large spectral range from 1.3 mum to 1.5 mum, with a footprint of 150 mum times 200 mum.
Keywords
diffraction gratings; multiplexing equipment; nanowires; optical communication equipment; silicon-on-insulator; amorphous silicon nanowire platform; cross-order echelle grating triplexer; diffraction orders; ultracompact silicon-on-insulator-based echelle-grating triplexer; wavelength 1.3 micron to 1.5 micron; Amorphous silicon; Arrayed waveguide gratings; Diffraction gratings; Optical device fabrication; Optical receivers; Optical refraction; Optical variables control; Optical waveguides; Passive optical networks; Photonics; SOI; WDM; Waveguide components; integrated optoelectronics; triplexer;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Internet, 2008. COIN 2008. 7th International Conference on
Conference_Location
Tokyo
Print_ISBN
978-4-88552-230-7
Electronic_ISBN
978-4-88552-229-1
Type
conf
Filename
4773365
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