Title :
MLSD coupled with LMMSE channel estimation for OFDM in time-variant channels
Author :
Tsai, Yuh-Ren ; Chung, Hsien-Yun
Author_Institution :
Inst. of Commun. Eng., Nat. Tsing Hua Univ., Hsinchu
Abstract :
For OFDM systems, high user mobility induces time-variation of channel response over symbol duration, causing orthogonality destruction and introducing intercarrier interference (ICI) among subcarriers. To enhance the performance, sequence detection schemes have been proposed with the availability of corresponding channel state information (CSI), which is generally obtained via channel estimation using some inserted preamble symbols. However, bandwidth efficiency is significantly degraded and long latency is introduced. In this work, without the need of inserting preamble symbols, we propose a linear minimum mean square error (LMMSE) channel estimation method coupled with the Viterbi-algorithm based maximum-likelihood sequence detection (MLSD) scheme to improve bandwidth efficiency and to minimize the detection latency. Hence this proposed scheme can be applied to real-time, delay-sensitive applications. Compared to other pilot-based ICI mitigation methods, our scheme has better performance, as well as better bandwidth efficiency.
Keywords :
OFDM modulation; adjacent channel interference; channel estimation; intercarrier interference; least mean squares methods; maximum likelihood estimation; time-varying channels; ICI mitigation methods; LMMSE channel estimation; OFDM; Viterbi-algorithm; bandwidth efficiency; channel estimation; channel response; channel state information; introducing intercarrier interference; maximum-likelihood sequence detection; orthogonality destruction; performance enhancement; sequence detection schemes; time-variant channels; Availability; Bandwidth; Channel estimation; Channel state information; Degradation; Delay; Interference; Maximum likelihood detection; Mean square error methods; OFDM;
Conference_Titel :
Communications, 2008. APCC 2008. 14th Asia-Pacific Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-4-88552-232-1
Electronic_ISBN :
978-4-88552-231-4