DocumentCode
48373
Title
Modeling the Channel Charge and Potential in Quasi-Ballistic Nanoscale Double-Gate MOSFETs
Author
Mangla, Anurag ; Sallese, Jean-Michel ; Sampedro, C. ; Gamiz, Francisco ; Enz, Christian
Author_Institution
Ecole Polytech. Fed. de Lausanne, Lausanne, Switzerland
Volume
61
Issue
8
fYear
2014
fDate
Aug. 2014
Firstpage
2640
Lastpage
2646
Abstract
In this paper, we present an analytical semiempirical model of the profile of the channel charge and potential in quasi-ballistic double-gate (DG) MOSFETs. The charge model is based on the premise of separating the charge density in the quasi-ballistic channel into two hypothetical components: 1) exclusively ballistic (collision-free) and 2) collision-dominated components, which are governed by the same electrostatics. These components are related to each other through a ballisticity parameter whose values lie between 0 and 1. Varying the value of this parameter allows us to model the charge profile continuously between diffusive and purely ballistic devices. Using the proposed charge model and the DG MOSFET electrostatics, an analytical expression for the channel potential is derived which, like the charge model, is continuous between the diffusive and ballistic regimes.
Keywords
MOSFET; ballistic transport; electrostatics; MOSFET electrostatics; MOSFET potential; channel charge modeling; channel charge profile; charge density; collision dominated component; collision-free component; exclusively ballistic component; quasiballistic channel; quasiballistic nanoscale double gate MOSFET; semiempirical model; Analytical models; Charge carrier density; Electric potential; Logic gates; MOSFET; Nanoscale devices; Semiconductor device modeling; Compact model; double-gate (DG) MOSFET; quasi-ballistic; quasi-ballistic.;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2327255
Filename
6832484
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