• DocumentCode
    484254
  • Title

    Reflectivity and DEM Estimation from Multi-baseline Complex SAR Signals

  • Author

    Evangelista, Annarita ; Meglio, Federica ; Schirinzi, Gilda

  • Author_Institution
    DAEIMI, Univ. di Cassino, Cassino
  • Volume
    3
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Multi-baseline interferometric Synthetic Aperture Radar (In-SAR) systems are used to obtain increased accuracy Digital Elevation Model (DEM) of the observed ground scene. The techniques which are commonly used exploit only the interferometric phase information, and are based on Maximum Likelihood (ML) estimation. Due to the difficulty of express the multi-baseline likelihood function in closed form, they adopt the statistical independence approximation of the interferometric phases. In this paper we present a method exploiting both amplitude and phase of the interferometric images, and allowing to express the multi-baseline likelihood function in closed form. It has also the advantage of correctly performing multi-baseline speckle reduction on the image intensity.
  • Keywords
    digital elevation models; geophysical techniques; maximum likelihood estimation; radar interferometry; remote sensing by radar; synthetic aperture radar; DEM estimation; Digital Elevation Model; In-SAR systems; Maximum Likelihood estimation; image intensity; interferometric Synthetic Aperture Radar; interferometric images; interferometric phase information; interferometric phases; multi-baseline likelihood function; multi-baseline speckle reduction; multivariate Gaussian signal model; observed ground scene; statistical independence approximation; Additive noise; Amplitude estimation; Layout; Maximum likelihood estimation; Noise level; Phase estimation; Pixel; Reflectivity; Speckle; Synthetic aperture radar interferometry; Synthetic aperture radar; multi-baseline interferometry; speckle reduction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779336
  • Filename
    4779336