DocumentCode :
484300
Title :
An Evaluation of the GOES-R ABI Aerosol Retrieval Algorithm
Author :
Liu, Hongqing ; Laszlo, Istvan ; Ciren, Pubu ; Zhou, Mi ; Kondragunta, Shobha
Author_Institution :
Perot Syst. Gov. Service, Inc., Lanham, MD
Volume :
3
fYear :
2008
fDate :
7-11 July 2008
Abstract :
A multi-channel aerosol retrieval algorithm has been developed for the Advanced Baseline Imager (ABI) onboard the next generation US Geostationary Operational Environmental Satellite (GOES-R series). Testing and evaluation of this algorithm is carried out with model simulated and satellite-observed multi-spectral reflectance. Sensitivity tests with synthetic reflectance show that ABI retrieved aerosol optical depth at 0.55 mum (tau0.55 mum) is expected to change by 5% and 9% (14% and 24%) on average over water (land) corresponding to 3% and 5% uncertainties in calibration. Model identification is expected to have a 50%-60% success rate for a 3%-5% calibration uncertainty. Performance of ABI aerosol retrieval is evaluated with MODIS observations. Compared with AERONET ground measurements, on average, retrieved tau0.55 mum differs from AERONET measurements by -0.02plusmn0.05 over water and 0.05plusmn0.17 over land. The effect of sensor polarization sensitivity on ABI aerosol retrievals is also estimated as a bias of -0.01 over water and -0.05 over land for the retrieved tau0.55 mum.
Keywords :
aerosols; atmospheric techniques; remote sensing; ABI; AERONET ground measurements; Advanced Baseline Imager; GOES-R series; MODIS observations; US Geostationary Operational Environmental Satellite; aerosol optical depth; multichannel aerosol retrieval algorithm; multispectral reflectance; sensor polarization sensitivity effect; Aerosols; Atmospheric modeling; Calibration; MODIS; Optical sensors; Polarization; Reflectivity; Satellite broadcasting; Testing; Uncertainty; Aerosol; Remote sensing; Satellite applications;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
Type :
conf
DOI :
10.1109/IGARSS.2008.4779396
Filename :
4779396
Link To Document :
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