• DocumentCode
    484369
  • Title

    Volumetric Gas Monitoring through an IR Laser Network for the Control of the Gas Emission Flux by Sensitive Areas: Methods and Simulation Results

  • Author

    Cuccoli, Fabrizio ; Facheris, Luca

  • Author_Institution
    CNIT-U.O. c/o Dept. of Electron. & Telecommun., Univ. of Florence, Florence
  • Volume
    3
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    A measurement approach for estimating the emission flux by gas soil sources, based on the use of IR laser measurements over optical links and atmospheric diffusion models is presented. An ad hoc disposition of the optical links close to the emission area allows the tomographic estimation of the gas concentration over a closed surface corresponding to an air volume that covers the emission area. The real time concentration measurements over this closed surface allow us to estimate the emission flux of the emission area, once the atmospheric diffusion conditions are known. In this paper, we present some simulation results assuming that the plane surfaces where laser measurements are made are the faces of a parallelepiped. Simulations are based on diffusion models where the air diffusion and transportation phenomena are due to the horizontal wind.
  • Keywords
    atmospheric composition; atmospheric movements; atmospheric techniques; diffusion; remote sensing by laser beam; tomography; IR laser network; atmospheric diffusion model; gas concentration; gas emission flux; gas soil sources; horizontal wind; optical links; sensitive areas; tomographic estimation; volumetric gas monitoring; Area measurement; Atmospheric measurements; Atmospheric modeling; Gas lasers; Laser modes; Monitoring; Optical control; Optical fiber communication; Soil measurements; Tomography; IR laser; atmospheric gas remote sensing; gas emission; tomographic reconstruction; volumetric monitoring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779497
  • Filename
    4779497