Title :
Sensitivity Analysis of the Simulated Annealing Method to Measurement Noise for the Inversion of Subsurface Parameters of Two Layer Rough Surfaces
Author :
Tabatabaeenejad, Alireza ; Moghaddam, Mahta
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI
Abstract :
We have shown that the method of simulated annealing (SA) is capable of inverting subsurface parameters of a three-dimensional, two-layer dielectric structure with slightly rough interfaces. In this work, we address the sensitivity of the Simulated Annealing to measurement noise. We also study the impact of the number of measurement parameters, i.e., number of frequency points and number of observation angles, on sensitivity of the inversion algorithm.
Keywords :
Gaussian noise; dielectric properties; geophysical techniques; inverse problems; measurement uncertainty; rough surfaces; sensitivity analysis; simulated annealing; Gaussian noise; dielectric structure; measurement noise; sensitivity analysis; simulated annealing method; subsurface parameter inversion; two layer rough surfaces; Analytical models; Computational modeling; Frequency measurement; Noise measurement; Pollution measurement; Rough surfaces; Sensitivity analysis; Simulated annealing; Surface roughness; Surface structures; Layered rough surfaces; Simulated Annealing; inversion; measurement parameters; noise; sensitivity; subsurface parameters;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779555
