Title :
The Effects of Finite Resolution on Radar Images of Fractal Profiles
Author :
Martino, Gerardo Di ; Iodice, Antonio ; Riccio, Daniele ; Ruello, Giuseppe
Author_Institution :
Dipt. di Ing. Elettron. e delle Telecomun., Univ. di Napoli "Federico II", Naples
Abstract :
In this paper a first step toward a complete model of the fractal imaging process is taken: for the sake of simplicity the mathematical details are here provided for a fractal profile with topological dimension equal to one. In particular, we show how the signal backscattered from a fractal profile modeled as a fractional Brownian motion (fBm) stochastic process is strictly linked to an associated fractional Gaussian noise (fGn) process. We compute in closed form the power density spectrum of the received signal in the simplified hypothesis of a linear dependence of the backscattered signal on the profile derivative process. Our results apply to physical fBm processes, as dictated by the low-pass filtering introduced by both the incident electromagnetic field wavelength and the finite sensor resolution. In the last section a numerical study of the above mentioned is also provided.
Keywords :
Brownian motion; backscatter; geophysical signal processing; geophysical techniques; image resolution; low-pass filters; radar imaging; radar resolution; remote sensing by radar; stochastic processes; electromagnetic field wavelength; finite sensor resolution; fractal imaging process; fractal profile model; fractional Brownian motion; fractional Gaussian noise process; low-pass filtering; natural surfaces; power density spectrum; radar image resolution; radar imaging process; received signal; signal backscatter; stochastic process; topological dimension; Brownian motion; Filtering; Fractals; Gaussian noise; Image resolution; Low pass filters; Mathematical model; Radar imaging; Signal processing; Stochastic processes; Fractals; microwave scattering;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-2807-6
Electronic_ISBN :
978-1-4244-2808-3
DOI :
10.1109/IGARSS.2008.4779557