• DocumentCode
    484480
  • Title

    Active Learning of Very-High Resolution Optical Imagery with SVM: Entropy vs Margin Sampling

  • Author

    Tuia, D. ; Ratle, F. ; Pacifici, F. ; Pozdnoukhov, A. ; Kanevski, M. ; Del Frate, F. ; Solimini, D. ; Emery, W.J.

  • Author_Institution
    Inst. of Geomatics & Anal. of Risk, Univ. of Lausanne, Lausanne
  • Volume
    4
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    An active learning method is proposed for the semi-automatic selection of training sets in remote sensing image classification. The method adds iteratively to the current training set the unlabeled pixels for which the prediction of an ensemble of classifiers based on bagged training sets show maximum entropy. This way, the algorithm selects the pixels that are the most uncertain and that will improve the model if added in the training set. The user is asked to label such pixels at each iteration. Experiments using support vector machines (SVM) on an 8 classes QuickBird image show the excellent performances of the methods, that equals accuracies of both a model trained with ten times more pixels and a model whose training set has been built using a state-of-the-art SVM specific active learning method.
  • Keywords
    entropy; geophysical techniques; geophysics computing; image classification; learning (artificial intelligence); remote sensing; support vector machines; QuickBird image; SVM; active learning method; entropy-based query bagging; image classification; machine learning method; margin sampling; remote sensing; semi-automatic selection; support vector machine; very-high resolution optical image; Entropy; Image classification; Image resolution; Image sampling; Iterative algorithms; Learning systems; Optical sensors; Remote sensing; Support vector machine classification; Support vector machines; Active learning; VHR imagery; entropy; margin sampling; query learning; support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779659
  • Filename
    4779659