DocumentCode
484501
Title
Development of a Scale Independent Approach for Landscape Pattern Metrics using Fourier Vector Analysis of Satellite Images
Author
Spivey, Alvin ; Vodacek, Anthony
Author_Institution
Digital Imaging & Remote Sensing Lab., Rochester Inst. of Technol., Rochester, NY
Volume
4
fYear
2008
fDate
7-11 July 2008
Abstract
Mapping land-cover land-use change (LCLUC) over regional and continental scales and long time scales can be accomplished using class maps derived from Earth observing satellites. Observations of landscape change can be related to processes like hydrologic or ecological function by employing image processing tools that produce landscape pattern metrics such as dominance, fractal dimension, and contagion. These landscape pattern metrics arise from local kernel operations that detect edges and gradients in class maps, and suffer from a lack of statistical independence and scalability. This paper describes an approach to generating landscape pattern metrics based on a Fourier system analysis of the entire class map or any subset of the class map such as a watershed. Three metric improvements are made. First, correlations between the metrics are removed. Second, image sourced statistical independence is abated. Third, the proposed metrics become, in a least squares sense, optimally scalable.
Keywords
Fourier transforms; image processing; pattern recognition; terrain mapping; vegetation mapping; LCLUC Mapping; Land-Cover Land-Use Change; contagion; dominance; earth observing satellite; ecological function; fourier vector analysis; fractal dimension; hydrologic function; image processing; kernel operation; landscape change observation; least squares analysis; pattern metrics; vegetation; Earth; Fractals; Image analysis; Image edge detection; Image processing; Kernel; Least squares methods; Pattern analysis; Satellites; Scalability; Correlation; Environmental factors; Fourier Transform; Image Processing; Pattern Recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4779689
Filename
4779689
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