• DocumentCode
    484510
  • Title

    Bayesian DEM Reconstruction from SAR and Optical Data

  • Author

    Ferraioli, Giampaolo ; Baselice, Fabio ; Pascazio, Vito

  • Author_Institution
    Dipt. per le Tecnol., Centro Direzionale di Napoli, Univ. di Napoli "Parthenope", Naples
  • Volume
    4
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    Interferometric SAR (InSAR) systems are able to estimate height profiles of the Earth surface. For the involved estimation problem, Maximum A Posteriori (MAP) statistical technique and Markov Random Field image models have been used, showing to be effective in case of multiple interferograms, obtained via different baselines/frequencies. In this paper, we are interested in the application of such estimation procedure in urban areas, where due to SAR geometry, many geometrical distortions appear. In particular, we focus on the layover problem. We present a procedure to manage layover areas, based on the optical and SAR data fusion. Moreover, we exploit the optical data to improve the a priori term of the MAP approach. We test the method on simulated data, showing the effectiveness of the method.
  • Keywords
    Markov processes; digital elevation models; geophysical techniques; height measurement; image reconstruction; radar interferometry; remote sensing by radar; sensor fusion; statistical analysis; synthetic aperture radar; Bayesian DEM reconstruction; Markov Random Field image models; Maximum A Posteriori statistical technique; data fusion; geometrical distortions; height profiles estimation; interferometric SAR systems; layover problem; optical data; synthetic aperture radar; Bayesian methods; Earth; Frequency estimation; Geometrical optics; Image reconstruction; Markov random fields; Optical distortion; Optical interferometry; Surface reconstruction; Synthetic aperture radar interferometry; SAR Interferometry; data fusion; layover; optical data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779700
  • Filename
    4779700