• DocumentCode
    484541
  • Title

    Multidimensional Image Classification based on Influence Controllers of the Classes in the Images

  • Author

    Máximo, Orlando Alves ; Fernandes, David

  • Author_Institution
    Comando-Geral de Tecnol. Aeroespacial, Inst. de Estudos Avancados, Campos
  • Volume
    4
  • fYear
    2008
  • fDate
    7-11 July 2008
  • Abstract
    The Bayesian statistical approach is a well known technique used in computer based image classification, and the Maximum Likelihood Classifier (ML) is one of the most present in literature. The structure of the ML Classifier is such that, in a multidimensional approach, every image used in the classification process has the same effect or contribution, regardless its intrinsic quality. This paper extends the concept of image influence controller in the Modified Global Membership Function (MGMF) to classes reliability factors in order to use class influence controllers instead a single image reliability factor. It is also proposed an estimator for the classes reliability factors based on the Confusion Matrix and its Conditional Kappa coefficient. Two SAR images are used to evaluate the estimator and the classification process that take into account the classes reliability factors.
  • Keywords
    Bayes methods; geophysical signal processing; image classification; image fusion; maximum likelihood estimation; Bayesian statistical approach; class influence controllers; conditional Kappa coefficient; confusion matrix; image fusion; image influence controller; maximum likelihood classifier; modified global membership function; multidimensional image classification; reliability factors; Bayesian methods; Image classification; Image fusion; Image processing; Layout; Maximum likelihood estimation; Multidimensional systems; Process control; Bayesian classification; Image Influence controllers; Image classification; Image processing; image fusion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    978-1-4244-2807-6
  • Electronic_ISBN
    978-1-4244-2808-3
  • Type

    conf

  • DOI
    10.1109/IGARSS.2008.4779739
  • Filename
    4779739