Title :
Fault-Tolerant SOI Microprocessor for Space Applications
Author :
Osipenko, Pavel N. ; Antonov, A.A. ; Klishin, Alexander V. ; Vasilegin, Boris V. ; Gorbunov, Maxim S. ; Dolotov, Pavel S. ; Zebrev, Gennady I. ; Anashin, Vasily S. ; Emeliyanov, Vladimir V. ; Ozerov, Alexander I. ; Chumakov, Alexander I. ; Yanenko, Andrey
Author_Institution :
Sci. Res. Inst. of Syst. Anal., Moscow, Russia
Abstract :
The design and experimental results are presented for the fault-tolerant 0.35 ìm SOI CMOS microprocessor. DICE-like cells are shown to be vulnerable to SEU during “read” and “write” modes.
Keywords :
CMOS digital integrated circuits; fault tolerance; microprocessor chips; silicon-on-insulator; DICE-like cells; SEU; complementary metal-oxide-semiconductor integrated circuits; dual interlocked storage cells; fault-tolerant SOI CMOS microprocessor; read modes; silicon-on-insulator; single-event upset; space applications; write modes; Fault tolerance; Fault tolerant systems; Microprocessors; Registers; Single event upset; Transistors; Tunneling magnetoresistance; CMOS; RHBD; Single-Event Upset (SEU); critical charge; dual interlocked storage (DICE); heavy ions; microprocessor; read mode; silicon-on-insulator (SOI); write mode;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2241453
