IEEE 1500 wrapper control using an IEEE 1149.1 test access port.

The relationship in electronics testing between the IEEE 1500 standard and the IEEE 1149.1 standards is very close, where the IEEE 1149.1 standard focuses on the testing of boards and the IEEE 1500 standard focuses on the testing of embedded cores within system on chips (SoC) on the boards. This paper presents a novel test controller architecture that facilitates the control and access to IEEE 1500 wrapped embedded cores within a SoC using an IEEE 1149.1 test access port. The test controller is based on a conventional IEEE 1149.1 state machine.