DocumentCode
48498
Title
Initial Success on Aluminum Circuit Board Technology
Author
Shou-Jen Hsu ; Chu-Hsuan Sha ; Lee, C.C.
Author_Institution
Mater. & Manuf. Technol., Univ. of California, Irvine, Irvine, CA, USA
Volume
3
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
1625
Lastpage
1631
Abstract
In this paper, aluminum circuit boards (ACBs) were designed, fabricated, and tested to demonstrate the possibility and advantages of the ACB technology. Processes were developed to grow high quality alumina (Al2O3) on Al boards and coat thick copper (Cu) layer over the alumina to produce an Al/alumina/Cu structure. The measured resistance and breakdown voltage of the as-formed 50 μm alumina layer is > 40 MΩ and 600 VDC respectively. In this design, heat generated by a high power circuit component attached to the Cu layer can conduct through the alumina layer and reach the Al base. Alumina has much higher thermal conductivity than epoxy-glass insulating layer of the popular FR-4 printed circuit boards. The quality of the boards produced in this paper was evaluated rigorously using scanning electron microscope. To test the reliability of the boards, they were put through 500 cycles of thermal cycling test between -40°C to +85°C and 100 h of high temperature storage test at 250 °C. To ensure its compatibility with soldering operations, 10 mm × 12 mm Cu substrates were bonded to the Al boards using a fluxless tin process. The thickness of the joint is 9.4 μm including the intermetallic layers. Despite significant coefficient of thermal expansion mismatch of the structure and large Cu size, the bonded samples show no sign of cracks, breakage, or degradation.
Keywords
alumina; aluminium; circuit reliability; copper; electric breakdown; electric resistance; printed circuit design; printed circuit manufacture; printed circuit testing; printed circuits; soldering; thermal conductivity; thermal expansion; thermal management (packaging); Al-Al2O3-Cu; Cu; alumina layer resistance; aluminum circuit board technology; breakdown voltage; fluxless tin process; heat generation; intermetallic layers; joint thickness; power circuit component; reliability; scanning electron microscope; size 50 mum; size 9.4 mum; soldering; temperature -40 degC to 85 degC; temperature 250 degC; thermal conductivity; thermal cycling test; thermal expansion coefficient mismatch; thick copper layer; time 100 h; Aluminum oxide; Conductivity; Electrical resistance measurement; Printed circuits; Resistance; Substrates; Thermal conductivity; Aluminum; soldering; substrate;
fLanguage
English
Journal_Title
Components, Packaging and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
2156-3950
Type
jour
DOI
10.1109/TCPMT.2013.2272557
Filename
6563097
Link To Document