Title :
Automation of Electronics Testing and Data Analysis for Process Control
Author :
Hoye, Mary C.Murphy
Author_Institution :
FAIRCHILD CAMERA AND INSTRUMENT CORPORATION
Abstract :
The increased costs involved in testing new complex devices and the need for rapid processing of information are driving the automation of the electronics test area. This paper presents a plan for the automatic collection and analysis of test information. Case studies are presented of system development and of its applications.
Keywords :
Automatic testing; Data analysis; Electronic equipment testing; Fabrication; Manufacturing automation; Process control; Semiconductor device testing; Software packages; Software testing; System testing;
Conference_Titel :
American Control Conference, 1984
Conference_Location :
San Diego, CA, USA
