DocumentCode
486117
Title
Automation of Electronics Testing and Data Analysis for Process Control
Author
Hoye, Mary C.Murphy
Author_Institution
FAIRCHILD CAMERA AND INSTRUMENT CORPORATION
fYear
1984
fDate
6-8 June 1984
Firstpage
757
Lastpage
762
Abstract
The increased costs involved in testing new complex devices and the need for rapid processing of information are driving the automation of the electronics test area. This paper presents a plan for the automatic collection and analysis of test information. Case studies are presented of system development and of its applications.
Keywords
Automatic testing; Data analysis; Electronic equipment testing; Fabrication; Manufacturing automation; Process control; Semiconductor device testing; Software packages; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1984
Conference_Location
San Diego, CA, USA
Type
conf
Filename
4788477
Link To Document