• DocumentCode
    486118
  • Title

    Computer Aided Control of the Integrated Circuit Manufacturing Process

  • Author

    Kaempf, Ulrich

  • Author_Institution
    HEWLETT-PACKARD LABORATORIES, PALO ALTO, CALIFORNIA
  • fYear
    1984
  • fDate
    6-8 June 1984
  • Firstpage
    763
  • Lastpage
    773
  • Abstract
    The characteristics of an integrated circuit manufacturing facility will be analyzed to determine in which areas computer aided tools will yield the highest benefits. A distributed transaction oriented process control system (PCS), with a flexible architecture for continuous expansion has been operational at several Hewlett-Packard IC facilities for five years. PCS includes a high-level, self-documenting process language editor for the definition of process recipes. Recipes are down-loaded from the central computer for the direct set-up and monitoring of equipment. In addition, PCS collects in-process measurements and tracking information into a wafer lot history file from which process engineers and supervisors can retrieve engineering and status information.
  • Keywords
    Circuit analysis computing; Computer aided manufacturing; Computer architecture; Computerized monitoring; History; Information retrieval; Integrated circuit manufacture; Integrated circuit yield; Personal communication networks; Process control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1984
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • Filename
    4788478