DocumentCode
486118
Title
Computer Aided Control of the Integrated Circuit Manufacturing Process
Author
Kaempf, Ulrich
Author_Institution
HEWLETT-PACKARD LABORATORIES, PALO ALTO, CALIFORNIA
fYear
1984
fDate
6-8 June 1984
Firstpage
763
Lastpage
773
Abstract
The characteristics of an integrated circuit manufacturing facility will be analyzed to determine in which areas computer aided tools will yield the highest benefits. A distributed transaction oriented process control system (PCS), with a flexible architecture for continuous expansion has been operational at several Hewlett-Packard IC facilities for five years. PCS includes a high-level, self-documenting process language editor for the definition of process recipes. Recipes are down-loaded from the central computer for the direct set-up and monitoring of equipment. In addition, PCS collects in-process measurements and tracking information into a wafer lot history file from which process engineers and supervisors can retrieve engineering and status information.
Keywords
Circuit analysis computing; Computer aided manufacturing; Computer architecture; Computerized monitoring; History; Information retrieval; Integrated circuit manufacture; Integrated circuit yield; Personal communication networks; Process control;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1984
Conference_Location
San Diego, CA, USA
Type
conf
Filename
4788478
Link To Document