Title :
Computer Aided Control of the Integrated Circuit Manufacturing Process
Author_Institution :
HEWLETT-PACKARD LABORATORIES, PALO ALTO, CALIFORNIA
Abstract :
The characteristics of an integrated circuit manufacturing facility will be analyzed to determine in which areas computer aided tools will yield the highest benefits. A distributed transaction oriented process control system (PCS), with a flexible architecture for continuous expansion has been operational at several Hewlett-Packard IC facilities for five years. PCS includes a high-level, self-documenting process language editor for the definition of process recipes. Recipes are down-loaded from the central computer for the direct set-up and monitoring of equipment. In addition, PCS collects in-process measurements and tracking information into a wafer lot history file from which process engineers and supervisors can retrieve engineering and status information.
Keywords :
Circuit analysis computing; Computer aided manufacturing; Computer architecture; Computerized monitoring; History; Information retrieval; Integrated circuit manufacture; Integrated circuit yield; Personal communication networks; Process control;
Conference_Titel :
American Control Conference, 1984
Conference_Location :
San Diego, CA, USA