Title :
Estimation of 25-Gbit/s VCSEL-MMF Link Penalties at 850 nm: Temperature Dependence
Author :
Kota Pavan, S. ; Decker, P.J. ; Yi Sun ; Lingle, R. ; Ralph, S.E.
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
We investigate the temperature dependence of the primary factors determining link performance- relative intensity noise (RIN), chromatic dispersion (CD), and the mode partition noise (MPN) of vertical cavity surface emitting laser (VCSEL)-based multimode fiber (MMF) links through an analysis of the bit error rate performance of the links and a comparison with our end-to-end analytic link model. The statistical fluctuations of VCSEL mode power depend on VCSEL temperature and may lead to link failure at specific temperatures due to MPN. We, therefore, examined the link performance for three 150-m OM4 grade MMFs for a wide range of VCSEL temperatures using automated methods. MPN was found to remain stable over temperature for the devices studied; furthermore, RIN and CD were found to be the dominant factors determining the link performance, while MPN was found to be insignificant for the links investigated.
Keywords :
error statistics; optical fibre networks; surface emitting lasers; MPN; OM4 grade MMF; RIN; VCSEL mode power; VCSEL temperature; VCSEL-based multimode fiber links; bit error rate performance; bit rate 25 Gbit/s; chromatic dispersion; end-to-end analytic link model; link performance; mode partition noise; relative intensity noise; size 150 m; statistical fluctuations; temperature dependence; vertical cavity surface emitting laser-based MMF links; wavelength 850 nm; Analytical models; Bit error rate; Noise; Optical fiber dispersion; Optical fibers; Temperature measurement; Vertical cavity surface emitting lasers; Analytic link modeling; Mode Partition Noise; Optical communication; Temperature dependence; VCSEL-based MMF link; VCSEL-based multimode fiber (MMF) link; mode partition noise (MPN); optical communication; optical fiber measurements; temperature dependence;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2014.2373370
