Title :
Single-Event Coupling Soft Errors in Nanoscale CMOS Circuits
Author :
Sayil, Selahattin ; Yeddula, Sumanth R. ; Juyu Wang
Author_Institution :
Dept. of Electr. Eng., Lamar Univ., Beaumont, TX, USA
Abstract :
There are various sources of single event transient (SET) errors for combinatorial logic circuits. This article discusses effects of various sources of SET errors and presents a comparative analysis in different technology nodes.
Keywords :
CMOS integrated circuits; combinational circuits; radiation hardening (electronics); SET errors; combinatorial logic circuits; nanoscale CMOS circuits; single event transient errors; single-event coupling soft errors; CMOS integrated circuits; Coupling circuits; Error correction; Integrated circuit reliability; Noise measurement; Particle measurements; Reliability; Single event transients; Coupling Noise; Single Event Crosstalk; Soft Error Reliability;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDAT.2013.2261432
