DocumentCode :
48732
Title :
Capacitor-Less Gate Drive Circuit Capable of High-Efficiency Operation for Non-Insulating-Gate GaN FETs
Author :
Hattori, Fumiya ; Umegami, Hirokatsu ; Yamamoto, Manabu
Author_Institution :
Dept. of Electron. & Control Syst. Eng., Shimane Univ., Matsue, Japan
Volume :
60
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
3249
Lastpage :
3255
Abstract :
Recently, Gallium Nitride (GaN) power devices have become very attractive because of their high power density. GaN FETs, however, differ from MOSFETs, and it is possible that GaN-based power electronics circuits show lower efficiency than Si-based circuits because of their unique characteristics. A capacitor-less gate drive circuit is proposed as a solution. This paper shows the effectiveness of a capacitor-less gate circuit in terms of gate drive loss, reverse conduction loss, and recovery loss, and compares it with capacitor-type gate drive circuits for GaN FETs. Drive loss analysis of an inverted gate drive circuit showing the lowest losses among capacitor-type gate drive circuits and a capacitor-less gate drive circuit was made to examine the differences between them. The results show that higher efficiency operation is obtained by applying a capacitor-less gate drive circuit to simple test circuits.
Keywords :
III-V semiconductors; driver circuits; elemental semiconductors; gallium compounds; power electronics; power field effect transistors; silicon; wide band gap semiconductors; GaN; MOSFET; Si; capacitor-less gate drive circuit; capacitor-type gate drive circuits; gate drive loss; high power density; high-efficiency operation; inverted gate drive circuit; non-insulating-gate FET; power devices; power electronics circuits; recovery loss; reverse conduction loss; Capacitors; Drives; Field effect transistors; Gallium nitride; Logic gates; Resistors; Threshold voltage; Capacitor-less gate drive circuit; gate drive loss; recovery loss; reverse conduction loss;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2013.2272094
Filename :
6563120
Link To Document :
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