DocumentCode :
48745
Title :
Analytic Representation of Bayes Labeling and Bayes Clustering Operators for Random Labeled Point Processes
Author :
Dalton, Lori A. ; Benalcazar, Marco E. ; Brun, Marcel ; Dougherty, Edward R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
63
Issue :
6
fYear :
2015
fDate :
15-Mar-15
Firstpage :
1605
Lastpage :
1620
Abstract :
Clustering algorithms typically group points based on some similarity criterion, but without reference to an underlying random process to make clustering algorithms rigorously predictive. In fact, there exists a probabilistic theory of clustering in the context of random labeled point sets in which clustering error is defined in terms of the process. In the present paper, given an underlying point process we develop a general analytic procedure for finding an optimal clustering operator, the Bayes clusterer, that corresponds to the Bayes classifier in classification theory. We provide detailed solutions under Gaussian models. Owing to computational complexity we also develop approximations of the Bayes clusterer.
Keywords :
Bayes methods; approximation theory; computational complexity; pattern clustering; probability; Bayes classifier; Bayes clustering operators; Bayes labeling operators; Gaussian models; analytic representation; classification theory; clustering algorithms; computational complexity; general analytic procedure; group points; optimal clustering operator; probabilistic theory; random labeled point processes; random process; Clustering algorithms; Optimization; Partitioning algorithms; Prediction algorithms; Probabilistic logic; Random processes; Signal processing algorithms; Bayes classification; Bayesian estimation; clustering; pattern recognition; small samples;
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/TSP.2015.2399870
Filename :
7029715
Link To Document :
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