• DocumentCode
    4875
  • Title

    A Residual Storage Life Prediction Approach for Systems With Operation State Switches

  • Author

    Xiao-Sheng Si ; Chang-Hua Hu ; Xiangyu Kong ; Dong-Hua Zhou

  • Author_Institution
    Dept. of Autom., Xi´an Inst. of High-Tech, Xi´an, China
  • Volume
    61
  • Issue
    11
  • fYear
    2014
  • fDate
    Nov. 2014
  • Firstpage
    6304
  • Lastpage
    6315
  • Abstract
    This paper concerns the problem of predicting residual storage life for a class of highly critical systems with operation state switches between the working state and storage state. A success of estimating the residual storage life for such systems depends heavily on incorporating their two main characteristics: 1) system operation process could experience a number of state transitions between the working state and storage state; and 2) system´s degradation depends on its operation states. Toward this end, we present a novel degradation model to account for the dependency of the degradation process on the system´s operation states, where a two-state continuous-time homogeneous Markov process is used to approximate the switches between the working state and storage state. Using the monitored degradation data during the working state and the available system operation information, the parameters in the presented model can be estimated/updated under Bayesian paradigm. Then, the posterior probabilistic law of the number of state transitions and their transition times are derived, and further, the formulation for the predicted residual storage life distribution is established by considering the possible state transitions in the future. To be solvable, a numerical solution algorithm is provided to calculate the distribution of the predicted residual storage life. Finally, we demonstrate the proposed approach by a case study for gyroscopes.
  • Keywords
    Bayes methods; Markov processes; condition monitoring; gyroscopes; Bayesian paradigm; gyroscopes; highly critical systems; operation state switches; posterior probabilistic law; residual storage life prediction approach; storage state; two-state continuous-time homogeneous Markov process; working state; Bayes methods; Computational modeling; Degradation; Gyroscopes; Monitoring; Predictive models; Silicon; Bayesian method; Markov process; condition monitoring (CM); degradation; gyroscope; lifetime estimation; parameter estimation; prediction method; prognostics and health management;
  • fLanguage
    English
  • Journal_Title
    Industrial Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0046
  • Type

    jour

  • DOI
    10.1109/TIE.2014.2308135
  • Filename
    6748088