• DocumentCode
    487509
  • Title

    The Characterization of High Temperature Electronics for Future Aircraft Engine Digital Electronic Control Systems

  • Author

    Wiley, J.D. ; Dening, D C

  • Author_Institution
    U WISCONSIN MADISON, MADISON WISCONSIN 53706
  • fYear
    1988
  • fDate
    15-17 June 1988
  • Firstpage
    1831
  • Lastpage
    1836
  • Abstract
    The characterization of high temperature electronics is presented including high temperature effects, semiconductors and barrier metallizations. Design solutions and material selections for mitigation of high temperature effects are indicated. The following semiconductor materials are considered as future high temperature candidates: - Silicon (Si) - Gallium arsenide (GaAs) - Gallium phosphide (GaP) - Silicon carbide (SiC) - Diamond like carbon (C) This characterization was originally prepared in accordance with the USAF Future Advance Controls Technology Study (FACTS).
  • Keywords
    Aerospace electronics; Aircraft propulsion; Control systems; Digital control; Gallium arsenide; III-V semiconductor materials; Metallization; Semiconductor materials; Silicon carbide; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1988
  • Conference_Location
    Atlanta, Ga, USA
  • Type

    conf

  • Filename
    4790025