DocumentCode
487509
Title
The Characterization of High Temperature Electronics for Future Aircraft Engine Digital Electronic Control Systems
Author
Wiley, J.D. ; Dening, D C
Author_Institution
U WISCONSIN MADISON, MADISON WISCONSIN 53706
fYear
1988
fDate
15-17 June 1988
Firstpage
1831
Lastpage
1836
Abstract
The characterization of high temperature electronics is presented including high temperature effects, semiconductors and barrier metallizations. Design solutions and material selections for mitigation of high temperature effects are indicated. The following semiconductor materials are considered as future high temperature candidates: - Silicon (Si) - Gallium arsenide (GaAs) - Gallium phosphide (GaP) - Silicon carbide (SiC) - Diamond like carbon (C) This characterization was originally prepared in accordance with the USAF Future Advance Controls Technology Study (FACTS).
Keywords
Aerospace electronics; Aircraft propulsion; Control systems; Digital control; Gallium arsenide; III-V semiconductor materials; Metallization; Semiconductor materials; Silicon carbide; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1988
Conference_Location
Atlanta, Ga, USA
Type
conf
Filename
4790025
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