DocumentCode
48832
Title
A 7-bit, 1.4 GS/s ADC With Offset Drift Suppression Techniques for One-Time Calibration
Author
Nakajima, Yoshiki ; Kato, Nei ; Sakaguchi, Akinori ; Ohkido, Toshio ; Miki, T.
Author_Institution
Mixed Signal Core Dev. Div., Renesas Electron. Corp., Kawasaki, Japan
Volume
60
Issue
8
fYear
2013
fDate
Aug. 2013
Firstpage
1979
Lastpage
1990
Abstract
This paper describes a digitally calibrated 7-bit, 1.4 GS/s flash analog-to-digital converter (ADC) implemented in 45-nm CMOS. The proposed offset drift suppression techniques for dynamic comparator and preamplifier make the ADC robust against environmental variation. As a result, once the ADC is calibrated at power up, no more calibration is necessary, even under VDD or temperature variations. The robustness is theoretically and experimentally verified. A calibration algorithm for doubling the ADC accuracy is also presented. The ADC occupies a small area of 0.085 mm2 and dissipates 33.24 mW at 1.4 GS/s from a 1.15 V supply.
Keywords
CMOS integrated circuits; analogue-digital conversion; preamplifiers; CMOS; VDD; analog-to-digital converter; calibration algorithm; dynamic comparator; environmental variation; flash ADC; offset drift suppression technique; one-time calibration; power 33.24 mW; preamplifier; size 45 nm; temperature variation; voltage 1.15 V; word length 7 bit; Ash; Calibration; Interpolation; Latches; Standards; Temperature dependence; Transistors; ADC; analog-to-digital conversion; calibration; comparator; flash; low power; offset drift suppression; one-time; preamplifier;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2013.2256236
Filename
6563128
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