Title :
A 7-bit, 1.4 GS/s ADC With Offset Drift Suppression Techniques for One-Time Calibration
Author :
Nakajima, Yoshiki ; Kato, Nei ; Sakaguchi, Akinori ; Ohkido, Toshio ; Miki, T.
Author_Institution :
Mixed Signal Core Dev. Div., Renesas Electron. Corp., Kawasaki, Japan
Abstract :
This paper describes a digitally calibrated 7-bit, 1.4 GS/s flash analog-to-digital converter (ADC) implemented in 45-nm CMOS. The proposed offset drift suppression techniques for dynamic comparator and preamplifier make the ADC robust against environmental variation. As a result, once the ADC is calibrated at power up, no more calibration is necessary, even under VDD or temperature variations. The robustness is theoretically and experimentally verified. A calibration algorithm for doubling the ADC accuracy is also presented. The ADC occupies a small area of 0.085 mm2 and dissipates 33.24 mW at 1.4 GS/s from a 1.15 V supply.
Keywords :
CMOS integrated circuits; analogue-digital conversion; preamplifiers; CMOS; VDD; analog-to-digital converter; calibration algorithm; dynamic comparator; environmental variation; flash ADC; offset drift suppression technique; one-time calibration; power 33.24 mW; preamplifier; size 45 nm; temperature variation; voltage 1.15 V; word length 7 bit; Ash; Calibration; Interpolation; Latches; Standards; Temperature dependence; Transistors; ADC; analog-to-digital conversion; calibration; comparator; flash; low power; offset drift suppression; one-time; preamplifier;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2013.2256236