• DocumentCode
    48872
  • Title

    Two-Part Gauss Simulation of Phosphor-Coated LED

  • Author

    Jin, Hye-Jin ; Jin, Seongwook ; Yuan, Kun ; Cen, S.

  • Author_Institution
    Coll. of Opt. & Electron. Technol., China Jiliang Univ., Hangzhou, China
  • Volume
    5
  • Issue
    4
  • fYear
    2013
  • fDate
    Aug. 2013
  • Firstpage
    1600110
  • Lastpage
    1600110
  • Abstract
    Gauss simulation is an effective tool for designing light-emitting-diode (LED) light sources. This paper proposes a new two-part Gauss simulation model to simulate a YAG:Ce phosphor-coated LED (PC-LED). This model divides the emission spectra of YAG:Ce phosphor into two parts, and they use different half spectral widths in the Gauss function to accurately simulate the spectra of YAG:Ce PC-LED. The simulated spectra are similar to the measured spectra of packaged LEDs; most correlated color temperature (CCT) error is less than 4%, color rendering index (CRI) error is less than 2, and luminous efficacy of radiation (LER) error is less than 3% for simulation results. This is a vast improvement on an ordinary single Gauss simulation model. Using the model to analyze the combination of common blue LED and YAG:Ce phosphor helps the design of new white LEDs.
  • Keywords
    cerium; colour; electronics packaging; light emitting diodes; optical design techniques; phosphors; photoluminescence; spectral line breadth; yttrium compounds; CCT error; CRI error; Gauss function; LER error; PC-LED; YAG:Ce; YAG:Ce phosphor; blue LED; color rendering index error; correlated color temperature error; emission spectra; light-emitting-diode light sources; luminous efficacy of radiation error; packaged LED; phosphor-coated LED; spectral widths; two-part Gauss simulation; white LED; Adaptive optics; Color; Light emitting diodes; Mathematical model; Measurement uncertainty; Phosphors; Light emitting diodes; luminescence and fluorescence; optical and other properties; theory and design;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2013.2272783
  • Filename
    6563133