Title :
Output Prediction in Presence of Systematic Model Mismatch
Author_Institution :
TCL, Eidgenössische Technische Hochschule, CH-8092 Zurich. Phone: +41 1 256 3113 Fax: +41 1 252 0975, Email: agarwal@csheth5a.bitnet
Abstract :
In system identification for output prediction, unknown systematic errors in the measurement model and systematic drifts in the parameters have conventionally been treated with ad-hoc methods like exponential forgetting and moving windows. Such devices, although useful for zero-mean random errors and slow drifts, yield "arbitrary" tuning-dependent parameter estimates and output predictions in the realistic case of systematic model mismatch. This work presents a new method that yields optimal output predictions in face of systematic errors and drifts, without involving the arbitrariness of any user-specified tuning knobs.
Keywords :
Delay effects; Delay estimation; Error correction; Measurement errors; Parameter estimation; Predictive models; Sampling methods; System identification; Vectors; Yield estimation;
Conference_Titel :
American Control Conference, 1992
Conference_Location :
Chicago, IL, USA
Print_ISBN :
0-7803-0210-9